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The diffusion of oxygen in silicon single-crystals

The diffusion of oxygen in silicon single-crystals

The small-angle neutron-scattering from SiO2 precipitates in a single crystal of silicon which has been heat treated for 500 hours at 600°C; the neutron beam was incident along a <100> direction. The central cross arises from the cushion shaped SiO2 precipitates lying on (100) planes with their edges along <110> directions.

Courtesy: S. Rycroft and R.J. Stewart (Univ. Reading)