Features:

• Automated .h5 files processing
• Automated Direct Beam (.h5) selection based on the data scan name
• Preview panels for Reflectivity Profile, Detector Images, Integrated 2D maps ("Pixel vs. Point number", "Theta vs. 2Theta", "Qx vs. Qz")
• Reductions / Corrections available:
  -- Devision by monitor / time
  -- Direct beam normalization (incl. DB attenuator factor)
  -- Background subtraction
  -- Over-illumination correction
  -- ROI selection
  -- Correction for "sample curvature"

Features:

• SLD calculation
• Fitting of specular reflectivity data measured using TOF instruments with:
  -- No polarisation (Air-Solid, Liquid-Solid)
  -- 2 Polarisations (Air-Solid)
  -- 4 Polarisations (Air-Solid)
• Fitting of specular reflectivity data measured using Monochromatic instruments with:
  -- No polarisation (Air-Solid, Liquid-Solid, periodical multilayers, fractional sample composition)
  -- 2 Polarisations (Air-Solid, periodical multilayers, fractional sample composition)
  -- 4 Polarisations (Air-Solid, periodical multilayers, fractional sample composition)

Features:

• Visualization of two detector images sum or difference
• Visualisation of all detector images sum for certain polarisation
• Reductions available:
  -- Normalisation by monitor
  -- Reductions of pixel density by 2, 4 or 8 times

Features:

• Simulation of off-specular 2D maps (Alpha_i vs. Alpha_f) measured using Monochromatic beamlines
• Simulation of off-specular 2D maps (Lambda vs. Alpha_f) measured using TOF beamlines

// Available soon