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D17 - Neutron reflectometer with horizontal scattering geometry

It is the first ILL dedicated reflectometer and it has been designed to be as flexible as possible in resolution and modes of operation. It is suitable for the analysis of surface structures in solids and solid/liquid interfaces. Horizontal surface experiments, such as free liquids, will suffer from a severe restriction in Q-range and flux and are thus not recommended for this instrument.

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Instruments & Support : Instruments & groups > D17 > Description

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Instrument layout

D17, is a neutron reflectometer with horizontal scattering geometry (vertical surfaces) designed to be as flexible as possible in resolution and modes of operation. It is suitable for the study of surface structures in solids and solid/liquid interfaces over a wide range of length scales.

Applications

  • The study of surfaces and buried interfaces of thin solid films and multilayers
  • Solid-liquid interfaces and membranes
  • Examination of off-specular reflectivity from atomic and magnetic in-plane structure
  • Kinetic studies of interface evolution.

Instrument layout

D17 operates in three modes:


Time-of-flight (TOF), non-polarised (polarising in future)
This is achieved by a double chopper system using wavelengths from 2 to 30 Å with great flexibility in resolution. This mode can simultaneously cover an order of magnitude in q in less than a minute, allowing the time evolution of a sample to be followed (kinetics). TOF-GISANS is also possible.

Non-polarising monochromatic mode

The non-poarised angle dispersive mode (high flux at 5.5 Å used over the entire q-range). Not suitable for kinetic studies as each point in q must be measured sequentially. GISANS possible.

Monochromatic, polarised beam
For the study of magnetic samples with a choice of polarisation analysis between a supermirror for the specular beam and a 3He cell covering the wide solid angle of the multidetector for off-specular studies. The instrument is ideal for the measurement of off-specular scattering arising from large scale in-plane structure, glancing incidence small angle scattering (GISANS) from smaller scale in-plane structure.