Although the structures of disordered systems such as liquids and glasses have been studied for over 50 years via Fourier transformation of diffraction data into real-space, it is only over the past decade or so that the use of real-space data analysis in diffraction has become increasingly popular for structural studies of crystalline systems showing some disorder.  In powder diffraction for example, Pair Distribution Function (PDF) analysis of total scattering data is sensitive to local static and dynamic disorder, and has thereby demonstrated complementarity to the well-known Rietveld refinement used to determine the time- and space-averaged structure of crystalline systems.

Real-space analysis of diffraction data deals with general structural concepts such as atomic distribution functions and structural correlation lengths, and now employs standard formulae common to neutron, x-ray and other diffraction techniques.  It therefore facilitates a synergetic convergence of hitherto largely disjoint communities: liquids/glasses diffraction and crystalline powder diffraction.

Building on the success of a previous workshop in Grenoble about 3 years ago (Total scattering PDF analysis using X-rays and neutrons: powder diffraction and complementary techniques, Oct 2007), we now propose a follow-up pedagogic workshop of extended participation, in particular as concerns the liquids/glasses community, but in general to all aspects of real-space data analysis in diffraction.  Other than educative lectures on the various techniques of real-space data analysis during the first part of the workshop, the last day will offer hands-on training and assistance with relevant data treatment software.

This pedagogic workshop aims to further the understanding and training of the various communities working on real-space data analysis for neutron, x-ray and other diffraction techniques. Fourier transformation of diffraction data into real-space, traditionally used for the structural determination of liquids and glasses, has recently seen increasing development in the field of crystalline powder diffraction where it complements the well-known Rietveld refinement of diffraction data. Real-space analysis of total-scattering data is sensitive to local, possibly time-dependent, structural disorder, and therefore enjoys a wide field of application, in particular to nano-structured materials. Other than presentations on the various scientific areas of application, this pedagogic workshop will include educative lectures and individual training sessions as concerns the experimental techniques and software available for real-space analysis of diffraction data.

Please, feel free to print out the poster and circulars, exhibiting them at your Universities or Institutes.

• First circular, 15 April 2011 (pdf file 394 K)
• Second circular, 15 June 2011
  
• Poster, May 2011
  

Dimension of posters is A0 vertical , which is about 840 x 1190 mm.