D10 - Four-circle diffractometer with three-axis energy analysis
D10+ is unique in being the only four-circle diffractometer with optional energy analysis as on three-axis spectrometers. It also possesses a unique four circle dilution cryostat for temperatures down to 0.1K, and offers high reciprocal-space resolution and low intrinsic background, to medium real-space resolution.
D10+ is a fully renewed and upgraded single crystal diffractometer delivering gains of approximately one order of magnitude compared to D10 due to the rebuilt and modernised H24 guide, dedicated end-of-guide position, optimised monochromators and new detector.
The upgrade includes the primary as well the secondary spectrometers with new bidimensional detector. It will be equipped also with a new analyser axis with continuous change of the incident wavelength.
This layout regroups several of the options of D10 (eulerian cradle, analyser, flat-cone detector) while they are not used all at the same time. The advanced He-3 cryostat is not shown except for the air cushion platform for its liquid He-4 Dewar.
Applications
Conventional crystallography
- Magnetic crystal structures
- Modulated structures
- Phase transitions, phase diagrams
- Diffraction at extremely high or low temperatures, under pressure, or in high magnetic fields
- Diffuse scattering
- Quasi-elastic scattering
- Crystalline thin films and multilayers
- Inelastic scattering in four-circle geometry
General Description
The versatile diffractometer D10 can be used in four different configurations:
- standard four-circle
- standard two-axis
- four-circle with energy analysis
- two-axis with energy analysis
The automatic monochromator protection allows a continuous change of the incident wavelength. Vertically focussing monochromator and analyser crystals increase the efficiency of the instrument. The sample and analyser tables move independently on air cushions, and the change between diffraction and triple-axis configurations can be made within the control program.
Two detectors are available in the diffraction configuration, an 80x80 mm2 two-dimensional microstrip detector for three-dimensional resolution in reciprocal space, or a single 3He detector when the highest efficiency and lowest background are required. In the diffraction configuration the detector may be inclined up to 30° to the equatorial plane to increase the out-of-plane access. A second single 3He detector is mounted on the analyser table for the triple-axis configuration. Background acquisitions can be made with the diffraction detector at the same time as scans are made in triple-axis mode.